“characterization of semiconductor materials”的概念、定义、翻译、参考文献-科学参考

单词	characterization of semiconductor materials
释义	characterization of semiconductor materials Encyclopedia 工学半导体材料性能检测释 characterization of semiconductor materials 半导体材料性能检测半导体材料测试是表征半导体材料性质、性能的技术，是半导体材料发展的重要组成部分。
随便看	minimum detectable brightness minimum detectable concentration minimum detectable error minimum detectable flux minimum detectable flux density minimum detectable quantity minimum detectable signal minimum detectable temperature difference minimum detonating section minimum deviation minimum deviation angle minimum deviation grating minimum diameter polygon minimum disclosure proof minimum distance minimum distance decoding minimum distance for network error correction code minimum distance method minimum distance receiver minimum edge covering minimum edit distance minimum efficient scale minimum e-folds minimum element minimum energy control method

科学参考收录了854744条科技类词条，基本涵盖了常见科技类参考文献及英语词汇的翻译，是科学学习和研究的有利工具。