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受激发射损耗显微术
释义
受激发射损耗显微术
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stimulated emission depletion microscopy
受激发射损耗显微术
利用环形受激损耗光锐化点扩散函数,从而达到突破衍射极限的目的,将光学成像系统的分辨率提高到几十纳米的基于特殊光场照明的超分辨荧光显微成像技术。可以用于成像细胞内的蛋白质、细胞器等非常精细的生物结构,或者研究生物大分子之间的相互作用,获取传统光学显微镜无法达到的超高分辨率图像。
Chemistry
>分析化学>仪器分析>释义
stimulated emission depletion (STED) microscopy
受激发射损耗显微术
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