“focused ion beam scanning electron microscopy”的概念、定义、翻译、参考文献-科学参考

单词	focused ion beam scanning electron microscopy
释义	focused ion beam scanning electron microscopy Encyclopedia 工学〔非常规油气实验测试技术〕释 focused ion beam scanning electron microscopy聚焦离子束扫描电镜用于纳米结构分析和纳米材料加工的仪器。
随便看	technological reserve technological risk technological strategy technological test for semiconductor process technological transformation technological type of ore technologies for waste heat and pressure energy recovery technology technology acceptance model technology acquisition technology ageing technology alliance Technology and Culture technology and innovation strategy technology and management close loop of quality problem technology assignment technology-based emission limits for stationary source technology/craft education technology cross-cutting technology design of deposit mining technology diffusion technology enablement technology-enhanced learning technology-enhanced teacher professional development technology evaluation

科学参考收录了854744条科技类词条，基本涵盖了常见科技类参考文献及英语词汇的翻译，是科学学习和研究的有利工具。